Electronic Design

Improving the Structural Stability Of Probe Cards

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
EDN

Probe card is designed for wafer-level packages

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...
The Victoria Advocate

Probe Card Market to grow by USD 1.73 Billion from 2025-2029, driven by increasing fab investments, Report on AI's role in market evolution - Technavio

Probe cards come in various types, including cantilever, membrane, and vertical designs, catering to different testing needs. Memory testing, power device testing, and calibration are essential ...
Electronic Design

IC ATE – Improving the Structural Stability Of Probe Cards

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...