A new technical paper, “3D atomic-scale metrology of strain relaxation and roughness in Gate-All-Around transistors via electron ptychography,” was published by researchers at Cornell University, ASM ...

Abstract: Fourier ptychographic microscopy (FPM) is a promising quantitative phase imaging technique with large fields of view and high resolution, but it requires precise illumination angles for ...

Abstract: Image super-resolution (SR) aims to recover low-resolution images to high-resolution images, where improving SR efficiency is a high-profile challenge. However, commonly used units in SR, ...

Mathematicians are still trying to understand fundamental properties of the Fourier transform, one of their most ubiquitous and powerful tools. A new result marks an exciting advance toward that goal.

When last we saw [xoreaxeax], he had built a lens-less optical microscope that deduced the structure of a sample by recording the diffraction patterns formed by shining a laser beam through it. At the ...