Image data fusion of SIMS and TOF-SIMS with a high spatial resolution is helpful to obtain a clearer score image by PCA. An image data fusion of SIMS and TOF-SMS in high spatial and mass resolution ...
Depth profiling techniques constitute a fundamental analytical approach in material science, enabling researchers to characterise the composition, structure and interfacial properties of complex ...
Thin films with desired mechanical, electrical, and optical properties are ubiquitous in modern life. The deposition of such advanced thin films, especially on small parts with complex shapes, is a ...
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